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Development of Ultra-Sensitive Capacitive Readout for Magnetic Resonance Force Microscopy

[+] Author Affiliations
Harish Bhaskaran, Keith Schwab

University of Maryland, College Park, MD

Denis Pelekhov, P. Chris Hammel

Ohio State University, Columbus, OH

Paper No. NANO2005-87052, pp. 11-12; 2 pages
doi:10.1115/NANO2005-87052
From:
  • ASME 4th Integrated Nanosystems Conference
  • Design, Synthesis, and Applications
  • Berkeley, California, USA, September 12–14, 2005
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-4208-8 | eISBN: 0-7918-3771-8
  • Copyright © 2005 by ASME

abstract

The use of nanomechanical devices to develop a scanned probe imaging technique known as “magnetic resonance force microscopy” (MRFM) has been among the most exciting thrust areas in nanomechanics in the last decade and a half. MRFM is a visionary project with the ultimate goal of imaging and identifying individual atomic species, both on the surface and below it [1]. This would be a revolutionary tool for material science, electronic device development, and imaging biological structures. Considerable progress has been made in the development of MRFM [2] in the past decade including the detection of a single-electron spin [3].

Copyright © 2005 by ASME

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