0

Full Content is available to subscribers

Subscribe/Learn More  >

Write Protrusion Modulation for Sub-Nanometer Contact Interference

[+] Author Affiliations
Bernhard Knigge, Barry Stipe, Robert Payne, Peter Baumgart

Hitachi Global Storage Technology, San Jose, CA

Paper No. WTC2005-63808, pp. 745-746; 2 pages
doi:10.1115/WTC2005-63808
From:
  • World Tribology Congress III
  • World Tribology Congress III, Volume 1
  • Washington, D.C., USA, September 12–16, 2005
  • Conference Sponsors: Tribology Division
  • ISBN: 0-7918-4201-0 | eISBN: 0-7918-3767-X
  • Copyright © 2005 by ASME

abstract

With the continual reduction in slider to disk clearance in hard disk drives, new methods to measure this clearance with high accuracy are needed. Understanding the contact dynamics when touching the disk at sub-nanometer interference levels is an important aspect of the problem. We have developed a new methodology to gradually bring the slider into contact with the disk, based on controlled and localized thermal expansion of the slider as it occurs during the regular write process (write induced protrusion). By applying short pulses to produce time controlled thermal protrusion, the duration of contact can be limited to a few milliseconds, by which short contacts and their contact hysteresis can be investigated.

Copyright © 2005 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In