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Two-Phase Hydrodynamic Modeling of Particulate Fluids in Sliding Contacts

[+] Author Affiliations
Elon Terrell, Jonathan Garcia, C. Fred Higgs, III

Carnegie Mellon University, Pittsburgh, PA

Paper No. WTC2005-63778, pp. 511-512; 2 pages
  • World Tribology Congress III
  • World Tribology Congress III, Volume 1
  • Washington, D.C., USA, September 12–16, 2005
  • Conference Sponsors: Tribology Division
  • ISBN: 0-7918-4201-0 | eISBN: 0-7918-3767-X
  • Copyright © 2005 by ASME


Chemical mechanical polishing (CMP) is a manufacturing process that uses controlled wear to planarize dielectric and metallic layers on silicon wafers. The wafer is polished by pressing it against a rotating pad that is flooded with slurry. The slurry itself is a fluid containing abrasive particles. Material removal rate (MRR) results have shown that the distribution of suspended particles in the slurry is significantly related to the wafer surface wear distribution during CMP. In this study, a simple model has been developed and solved as a preliminary step in analyzing the migration of the particles.

Copyright © 2005 by ASME



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Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

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