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An Atomic Force Microscopy Indentation Study of Biomaterial Properties

[+] Author Affiliations
E. J. Berger, S. Tripathy

University of Virginia, Charlottesville, VA

K. Vemaganti, Y. M. Kolambkar, H. X. You, K. Courtney

University of Cincinnati, Cincinnati, OH

Paper No. WTC2005-63244, pp. 229-230; 2 pages
doi:10.1115/WTC2005-63244
From:
  • World Tribology Congress III
  • World Tribology Congress III, Volume 1
  • Washington, D.C., USA, September 12–16, 2005
  • Conference Sponsors: Tribology Division
  • ISBN: 0-7918-4201-0 | eISBN: 0-7918-3767-X
  • Copyright © 2005 by ASME

abstract

Atomic force microscopy (AFM) is a powerful and increasingly common modality of biomechanical investigation, including imaging, force spectroscopy, and microrheology. AFM indentation of biomaterials requires use of a contact model for data interpretation and material property extraction, and a large segment of the scientific community uses the Hertz model or a close relative for small-scale indentation of thin, soft materials in high strain applications. We present experimental results and analytical/numerical modeling which lead to two main conclusions: (i) Hertzian mechanics are useful in a surprisingly large parameter range, including scenarios in which the underlying assumptions are seemingly violated, and (ii) the Hertz solution serves as a useful base from which power-series type solutions can be derived for a variety of non-Hertzian effects.

Copyright © 2005 by ASME

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