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Grain Formation and Intergrain Stresses in a Sn-Ag-Cu Solder Ball

[+] Author Affiliations
Seungbae Park, Ramji Dhakal, Lawrence Lehman, Eric Cotts

State University of New York at Binghamton, Binghamton, NY

Paper No. IPACK2005-73058, pp. 1095-1100; 6 pages
  • ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference
  • Advances in Electronic Packaging, Parts A, B, and C
  • San Francisco, California, USA, July 17–22, 2005
  • Conference Sponsors: Heat Transfer Division and Electronic and Photonic Packaging Division
  • ISBN: 0-7918-4200-2 | eISBN: 0-7918-3762-9
  • Copyright © 2005 by ASME


The thermo-mechanical behavior of near eutectic lead-free SnAgCu (SAC) solder joints under Deep Thermal Cycling (DTC) and in-situ thermal loading was examined. Crossed polarizer, optical microscopy revealed that in ball grid array (BGA) solder joints, these Sn rich, Pb-free solders exhibit large grained Sn structures. After imaging, these SnAgCu solder joints were subjected to repeated thermal stresses under an inert atmosphere. Subsequent to this thermal loading, the samples were again examined with optical microscopy. Using both data sets, the intergrain strains and deformations were quantified by Digital image correlation, a full field optical measurement technique. The relations between the positions of grains as well as intermetallics compounds, their boundaries and Sn deformation fields were examined.

Copyright © 2005 by ASME



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