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Comparing Shock, Random and Sine Vibration Loads of the Electronic Equipment

[+] Author Affiliations
Frank Fan Wang

Crane Aerospace & Electronics, Lynnwood, WA

Paper No. IPACK2005-73005, pp. 1083-1088; 6 pages
doi:10.1115/IPACK2005-73005
From:
  • ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference
  • Advances in Electronic Packaging, Parts A, B, and C
  • San Francisco, California, USA, July 17–22, 2005
  • Conference Sponsors: Heat Transfer Division and Electronic and Photonic Packaging Division
  • ISBN: 0-7918-4200-2 | eISBN: 0-7918-3762-9
  • Copyright © 2005 by ASME

abstract

It is a challenge to correlate different dynamic loads. Often, attempts are made to compare the peak acceleration of sine wave to the root mean square (RMS) acceleration of random vibration and shock. However, peak sine acceleration is the maximum acceleration at one frequency. Random RMS is the square root of the area under a spectral density curve. These are not equivalent. This paper is to discuss a mathematical method to compare different kinds of dynamic damage at the resonant point of the related electronic equipment. The electronic equipment will vibrate at its resonance point when there are dynamic excitations. The alternative excitation at the resonant frequency causes the most damage. This paper uses this theory to develop a method to correlate different dynamic load conditions for electronic equipment. The theory is that if one kind of dynamic load causes the same levels of damaging effects as the other, the levels of vibration can then be related.

Copyright © 2005 by ASME

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