0

Full Content is available to subscribers

Subscribe/Learn More  >

The Electric Double Layer Effect on the Microchannel Flow Stability

[+] Author Affiliations
Sedat Tardu

Laboratoire des Ecoulements Géophysiques et Industriels, Grenoble Cedex, France

Paper No. ICMM2003-1045, pp. 381-388; 8 pages
doi:10.1115/ICMM2003-1045
From:
  • ASME 2003 1st International Conference on Microchannels and Minichannels
  • 1st International Conference on Microchannels and Minichannels
  • Rochester, New York, USA, April 24–25, 2003
  • Conference Sponsors: Nanotechnology Institute
  • ISBN: 0-7918-3667-3
  • Copyright © 2003 by ASME

abstract

The effect of the electric double layer (EDL) on the linear stability of Poiseuille planar channel flow is reported. It is shown that the EDL destabilises the linear modes, and that the critical Reynolds number decreases significantly when the thickness of the double layer becomes comparable with the height of the channel. The planar macro scale Poiseuille flow is metastable, and the inflexional EDL instability may further decrease the macro-transitional Reynolds number. There is a good correspondence between the estimated transitional Reynolds numbers and some experiments, showing that early transition is plausible in microchannels under some conditions.

Copyright © 2003 by ASME

Figures

Tables

Interactive Graphics

Video

Country-Specific Mortality and Growth Failure in Infancy and Yound Children and Association With Material Stature

Use interactive graphics and maps to view and sort country-specific infant and early dhildhood mortality and growth failure data and their association with maternal

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In