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Probabilistic Analysis and Design of a MEMS Re-Entry Switch

[+] Author Affiliations
R. V. Field, Jr., S. Reese

Sandia National Laboratories

Paper No. IMECE2005-82492, pp. 369-376; 8 pages
doi:10.1115/IMECE2005-82492
From:
  • ASME 2005 International Mechanical Engineering Congress and Exposition
  • Microelectromechanical Systems
  • Orlando, Florida, USA, November 5 – 11, 2005
  • Conference Sponsors: Microelectromechanical Systems Division
  • ISBN: 0-7918-4224-X | eISBN: 0-7918-3769-6
  • Copyright © 2005 by ASME

abstract

The probabilistic analysis and design of a MEMS switch during atmospheric re-entry is discussed. The switch is modeled as a classical vibro-impact system: a single degree-of-freedom oscillator subject to impact with a single rigid barrier. The excitation is assumed stationary, Gaussian, with prescribed PSD to represent the re-entry environment. A subset of the model parameters are described as random variables to represent the significant unit-to-unit variability observed during fabrication and testing of the device. The metric of performance is the amount of time the switch remains closed during the re-entry event.

Copyright © 2005 by ASME

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