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MEMS Testbed for Mechanical Testing of Nanowires

[+] Author Affiliations
A. A. Desai, M. A. Haque, P. C. Eklund

Pennsylvania State University

Paper No. IMECE2005-81987, pp. 365-368; 4 pages
  • ASME 2005 International Mechanical Engineering Congress and Exposition
  • Microelectromechanical Systems
  • Orlando, Florida, USA, November 5 – 11, 2005
  • Conference Sponsors: Microelectromechanical Systems Division
  • ISBN: 0-7918-4224-X | eISBN: 0-7918-3769-6
  • Copyright © 2005 by ASME


In this paper, we present a MEMS test bed for electromechanical testing of nanowires and nanotubes. The MEMS device exploits the mechanics of post buckling deformation of slender columns to achieve very high force and displacement resolution. The proposed technique involves manipulating the nanowire or nanotube to the device site and hence is applicable to any type of one-dimensional solid. Initial experiments on semiconducting ZnO nanowires estimated the elastic modulus to be 1 GPa.

Copyright © 2005 by ASME



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